Resolution and stability analysis in full-aperture, linearized conductivity and wave imaging
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- by Habib Ammari, Josselin Garnier and Knut Sølna PDF
- Proc. Amer. Math. Soc. 141 (2013), 3431-3446 Request permission
Abstract:
In this paper we consider resolution estimates in both the linearized conductivity problem and the wave imaging problem. Our purpose is to provide explicit formulas for the resolving power of the measurements in the presence of measurement noise. We show that the low-frequency regime in wave imaging and the inverse conductivity problem are very sensitive to measurement noise, while high frequencies increase stability in wave imaging.References
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Additional Information
- Habib Ammari
- Affiliation: Department of Mathematics and Applications, École Normale Supérieure, 45 Rue d’Ulm, 75005 Paris, France
- MR Author ID: 353050
- Email: habib.ammari@ens.fr
- Josselin Garnier
- Affiliation: Laboratoire de Probabilités et Modèles Aléatoires and Laboratoire Jacques-Louis Lions, Université Paris VII, 75205 Paris Cedex 13, France
- Email: garnier@math.jussieu.fr
- Knut Sølna
- Affiliation: Department of Mathematics, University of California, Irvine, California 92697
- Email: ksolna@math.uci.edu
- Received by editor(s): August 26, 2011
- Received by editor(s) in revised form: December 6, 2011
- Published electronically: June 11, 2013
- Additional Notes: This work was supported by the ERC Advanced Grant Project MULTIMOD–267184.
- Communicated by: Walter Craig
- © Copyright 2013 American Mathematical Society
- Journal: Proc. Amer. Math. Soc. 141 (2013), 3431-3446
- MSC (2010): Primary 35R30, 35B30
- DOI: https://doi.org/10.1090/S0002-9939-2013-11590-X
- MathSciNet review: 3080166